Atomic Force Microscopy (AFM)
(กล้องจุลทรรศน์แรงอะตอม (AFM))
Definition
Atomic Force Microscopy (AFM) (กล้องจุลทรรศน์แรงอะตอม (AFM)) Hard Skill
Atomic Force Microscopy (AFM) is a high-resolution scanning probe technique used to image, measure, and manipulate surfaces at the nanoscale by detecting forces between a sharp probe and the sample surface.
Expertise Level
Level 1
Basic
1. Understands the basic principles and components of AFM.
2. Can operate AFM equipment with supervision.
3. Able to prepare simple sample surfaces for AFM imaging.
Level 2
Intermediate
1. Can independently operate AFM to acquire quality images.
2. Able to optimize imaging parameters for different sample types.
3. Understands common artifacts and can troubleshoot AFM operation issues.
Level 3
Advanced
1. Can perform advanced AFM modes such as force spectroscopy or electrical measurements.
2. Able to design experiments involving AFM for complex surface characterization.
3. Interprets and analyzes AFM data to provide detailed nanoscale surface information.
