Scanning Electron Microscopy (SEM)

(กล้องจุลทรรศน์อิเล็กตรอนแบบส่องกราด (SEM))

Definition

Scanning Electron Microscopy (SEM) (กล้องจุลทรรศน์อิเล็กตรอนแบบส่องกราด (SEM)) Hard Skill

Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses focused beams of electrons to produce high-resolution, three-dimensional images of sample surfaces for detailed analysis.

Expertise Level

skill-level-0

Level 1

Basic

1. Understands the basic principles of SEM operation.

2. Can prepare simple samples for SEM analysis with guidance.

3. Can operate SEM under supervision to acquire images.

skill-level-1

Level 2

Intermediate

1. Can independently prepare and mount a variety of samples appropriately.

2. Able to adjust SEM parameters (e.g., magnification, focus, voltage) to optimize image quality.

3. Understands and applies basic image analysis techniques for surface characterization.

skill-level-2

Level 3

Advanced

1. Expert in complex sample preparation techniques including coating and cross-sectioning.

2. Can optimize SEM settings for advanced applications such as elemental analysis or 3D imaging.

3. Capable of troubleshooting SEM hardware and software issues and training others.

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