Scanning Probe Microscopy
(กล้องจุลทรรศน์แบบสแกนโปรบ)
Definition
Scanning Probe Microscopy (กล้องจุลทรรศน์แบบสแกนโปรบ) Hard Skill
A technique that uses a physical probe to scan the surface of a sample at a very fine scale, providing detailed topographical and property information at the nanoscale level.
Expertise Level
Level 1
Basic
1. Understands the basic principles and components of scanning probe microscopy.
2. Can operate scanning probe microscopes under supervision.
3. Able to prepare simple samples for imaging.
Level 2
Intermediate
1. Can independently operate the microscope and optimize imaging parameters.
2. Able to analyze surface properties and interpret microscopy data.
3. Prepares complex samples and conducts routine maintenance of equipment.
Level 3
Advanced
1. Designs and executes advanced experiments using scanning probe microscopy techniques.
2. Develops new methods or modifications to enhance imaging or analysis precision.
3. Interprets complex data to support research and innovation in nanotechnology.
